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Semiconductor Facility Inspection & NDT
Non-destructive testing and monitoring services for semiconductor manufacturing facilities and their support systems.
Overview
TechCorr provides non-destructive testing and monitoring services to semiconductor manufacturing facilities. Work is scoped to the plant's support systems — process piping, vessels, chillers and heat exchangers, and structural assets.
Inspection Methods
- Ultrasonic thickness testing and automated corrosion mapping
- Radiographic testing and digital radiography
- Phased array ultrasonic testing (PAUT)
- Eddy current and remote field testing
- Penetrant and magnetic particle testing
- Visual inspection, borescopes, and video crawlers
- Infrared thermography
- Rope access for work at height
Tell us the asset type and the scope of work, and we will confirm the inspection methods and crew for the job.
Delivering excellence across semiconductor assets
In the Field
Semiconductor in Action
Our suite of services
Services for Semiconductor
2 capabilities covering 46 service lines. Open a capability to see the individual services, or jump straight to its overview page.
Alternating Current Field Measurement (ACFM)API Visual InspectionAutomated Corrosion MappingAutomated Ultrasonic Testing (AUT)Creaform Laser TestingDigital RadiographyDye Penetrant Testing (PT)Eddy Current (EC) TestingElectromagnetic Acoustic Testing (EMAT)External Drone InspectionFull Matrix Capture (FMC) & Total Focus Method (TFM)Hardness TestingHigh-Temperature Hydrogen Attack (HTHA)Infrared Thermography InspectionInternal Drone InspectionLong Range (LRUT) / Guided Wave (GWUT) Ultrasonic TestingMagnetic Particle Testing (MT)Phased Array Ultrasonic Testing (PAUT)Positive Material Identification (PMI)Pulsed Eddy Current (PEC) InspectionRadiographic Testing (RT)Shear Wave TestingSurface Eddy Current for Stress Corrosion Cracking (SCC)Time of Flight Diffraction (TOFD)Touch Point Corrosion (TPC)Ultrasonic P-ScanUltrasonic Thickness Testing (UTT)Video Crawlers & BorescopesVisual Testing Inspection (VT)Visual InspectionConventional NDEAdvanced NDEUAV Drone InspectionComputed RadiographyDemag SolutionsCorrosion Under Pipe Supports (CUPS)Facilities Piping InspectionFlare Tip MaintenanceHF Alkylation Units and Residual Elements ProgramsIntegrated Robotic Wire Inspection System (IRWIS)Permasense Corrosion Monitoring Sensor InstallationsSphere & Drum Internal InspectionSurface Eddy Current Crack Detection
Ready to discuss your semiconductor project?
Our team of experts is ready to help with your semiconductor needs. Request a quote or ask us any questions.